개요 | Wafer상태의 RFID Flip Chip 을 ACP를 사용하여 Roll Type Film에 Bonding |
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Performance | 처리량 | 5,000 UPH 이상 (based on 100% wafer yield, application dependent see UPH map) |
가동시간 | >94 % | |
산출량 | >98 % (투입 재료 품질에 기인함) | |
Room class (Recommend) | About 5,000-10,000 (SMT 환경) | |
Model change method | JIG(SLITTER SPACER) , Program , Pick up tool | |
Wafer and Die Handling | Wafer size | 6", 8", 12" (mounted on 8" standard frames) |
Die size | 0.3 mm - 1.2 mm | |
Die 두께 | 0.1 mm - 0.9 mm | |
Wafer mapping | (all formats) | |
Bonding (Pre-Bonding) |
Method | Pick-flip-place |
정밀도 | 40μ @ 3Sigma | |
Bonding delay | Programmable (typical 0 ms) | |
Alignment method | Fiducial (substrate camera) | |
Curing System (Final Bonding) |
Bond method | Thermode |
Bond head | 24 head (standard) | |
Bonding force | Max 90g | |
Force resolution | +/- 5%, min | |
Thermode tip size | 13x13 mm | |
Coplanarity | +/- 20μ per 1mm | |
Protective Tape | prevent thermodes from epoxy contamination |